The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2012

Filed:

Oct. 15, 2008
Applicants:

Dug Young Kim, Gwangju, KR;

Sucbei Moon, Gwangju, KR;

Dongsoo Lee, Gwangju, KR;

Inventors:

Dug Young Kim, Gwangju, KR;

Sucbei Moon, Gwangju, KR;

Dongsoo Lee, Gwangju, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/10 (2006.01); G01N 21/61 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is an apparatus for measuring a fluorescence lifetime. The apparatus for measuring the fluorescence lifetime comprises an excitation light generator that generates excitation light to be irradiated on a sample including fluorescence molecules; a fluorescence photon collecting unit that collects a plurality of fluorescence photons generated by irradiating the excitation light on the sample; a light sensor that converts the collected fluorescence photons into a fluorescence electrical signal; and a fluorescence lifetime signal processor that determines the fluorescence lifetime by calculating the average time of the fluorescence electrical signal with respect to a predetermined apparatus delay time. According to the above configuration, the present invention can accurately and precisely measure a fluorescence lifetime in a short measurement time by easy calculation.


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