The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2012
Filed:
Jul. 19, 2006
Yoshio Tsunazawa, Kyoto, JP;
Yukihisa Wada, Kyoto, JP;
Naoji Moriya, Kyoto, JP;
Kenji Takubo, Kyoto, JP;
Shinichiro Totoki, Kyoto, JP;
Haruo Shimaoka, Kyoto, JP;
Yoshio Tsunazawa, Kyoto, JP;
Yukihisa Wada, Kyoto, JP;
Naoji Moriya, Kyoto, JP;
Kenji Takubo, Kyoto, JP;
Shinichiro Totoki, Kyoto, JP;
Haruo Shimaoka, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
A distribution of AC electric field regularly arranged in a cell is formed while storing a sample having particles dispersed in a medium in the cell, whereby the particles are dielectrically migrated in the medium to generate a diffraction grating by density distribution of the particles. Diffracted light generated by irradiating the diffraction grating by density distribution with measuring light is detected, and evaluation of dielectrophoretic intensities of the particles and/or the medium is performed from the detection result. According to this method, evaluation of dielectrophoretic characteristics can be performed without adhering a phosphor to particles, and since even a particle small in size can achieve a detection level by collecting a number of such particles to form a diffraction grating, dielectric characteristics of microparticles of several nanometers in diameter can be thus quantitatively measured with high sensitivity.