The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2012
Filed:
Aug. 19, 2009
Kenichi Shidara, Kanagawa, JP;
Kenichi Shidara, Kanagawa, JP;
Fujifilm Corporation, Tokyo, JP;
Abstract
An image of a test chart having a test pattern is taken with an electronic endoscope. A DSP of a processing device generates a test pattern image from image signals input from the electronic endoscope. An image compositor composites the test pattern image and a test mask image having a predetermined reference pattern and generates a test mask composite image. An inspector visually measures positional and rotational displacement amounts of the test pattern with respect to the reference pattern in the test mask composite image displayed on a monitor, and inputs measurement results as displacement amount information to the processing device. The displacement amount information is stored in an EEPROM of the electronic endoscope. The processing device calibrates an endoscope image of a body cavity based on the displacement amount information input from the electronic endoscope.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile