The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Jan. 07, 2011
Takahiro Kimura, Musashino, JP;
Takahiro Kimura, Musashino, JP;
Yokogawa Electric Corporation, Musashino-shi, Tokyo, JP;
Abstract
A semiconductor test apparatus sorts addresses corresponding to memory cells in memory provided in a device under test, as well as failure data obtained as a result of testing the memory cells, and stores the sorted addresses and failure data in acquisition memory using burst access. The semiconductor test apparatus is provided with: an address generator configured to generate a burst target signal, which indicates that the addresses and failure data are target data for burst access; and a sort circuit configured to sort the addresses and failure data in order of continuous addresses suitable for burst access, on the basis of the burst target signal.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile