The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Apr. 16, 2009
Gary R. Morrison, Austin, TX (US);
Gary R. Morrison, Austin, TX (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A method of testing a memory includes generating a plurality of addresses, such as a test address, accessing contents of each of the plurality of addresses and storing them in storage circuitry, performing a test on the plurality of addresses, accessing the memory test circuitry by sending an access address to snooping circuitry, determining if the access address matches at least one of the plurality of addresses and generating at least one hit indicator in response thereto, generating a snoop miss indicator, determining if the snoop miss indicator indicates a miss, if the snoop miss indicator indicates a miss, accessing the memory in response to the access address, and if the snoop miss indicator does not indicate a miss, either storing snooped data from a interconnect master to a selected portion of the storage circuitry or reading the snooped data from the selected portion of the storage circuitry to the interconnect master.