The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Jun. 13, 2011
Ramakrishna Yellapantula, Libertyville, IL (US);
Yinghui LI, Cupertino, CA (US);
Dirk J. M. Walvis, Santa Cruz, CA (US);
Ramakrishna Yellapantula, Libertyville, IL (US);
Yinghui Li, Cupertino, CA (US);
Dirk J. M. Walvis, Santa Cruz, CA (US);
Litepoint Corporation, Sunnyvale, CA (US);
Abstract
A system and method is disclosed for testing a communication device. In accordance with the described invention, a single vector signal generator (VSG) is utilized to test manufactured 2x2, 3x2 and 4x2 MIMO wireless devices to identify possible manufacturing defects that may impair or disable the device under test (DUT) receivers from properly receiving constituted MIMO TX signals and accurately decoding the bits/symbols conveyed by transmitted TX signals. Disclosed embodiments may include a VSG coupled to a DUT. The VSG being configured to transmit data packets as a first codeword and a second codeword, wherein the VSG includes software and hardware architecture to manipulate the first codeword and the second codeword as emulated first and second waveforms, wherein the first waveform is different than the second waveform. The DUT being configured to receive the emulated first and second waveforms as prescribed signals from the VSG. The prescribed signals including a first received signal and a second received signal, wherein the DUT includes software and hardware architecture to manipulate the first received signal and the second received signal to generate block error rate results therefrom.