The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Nov. 19, 2009
Erik D. Dahl, Charlotte, NC (US);
Rajat Wadhwani, Closter, NJ (US);
Michael J. Ragunas, Weddington, NC (US);
Erik D. Dahl, Charlotte, NC (US);
Rajat Wadhwani, Closter, NJ (US);
Michael J. Ragunas, Weddington, NC (US);
Bank of America Corporation, Charlotte, NC (US);
Abstract
A risk framework is described for computing application risks. A risk value associated with each of one or more products included in an application may be determined. The risk value associated with each of the products may be classified as declining software risk, not-permitted software risk, declining hardware risk, and not-permitted hardware risk and may be weighted and summed to produce a technical risk score. A business criticality score may be computed based on how critical the application is to a business. The technical risk score and the business criticality score may be weighted and summed to produce a composite risk score. Based on one or more of the scores, planning may be conducted and strategies may be formulated to mitigate risk.