The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2012

Filed:

Dec. 21, 2009
Applicant:

Daniel Hoffman, San Diego, CA (US);

Inventor:

Daniel Hoffman, San Diego, CA (US);

Assignee:

Teradata US, Inc., Dayton, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatus, systems, and methods may operate to acquire an original data set comprising a series of data points having an independent portion and a dependent portion, the dependent portion representing a measure of device performance that depends on at least one device characteristic represented by the independent portion. Additional activity may include identifying outlier data points in the series by determining, in comparison with all other members of the series, whether the outlier data points conform to a known trend of the series; transforming the original data set into a transformed data set by removing the outlier data points from the series; and publishing the transformed data set. Other apparatus, systems, and methods are disclosed.


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