The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2012

Filed:

Sep. 11, 2008
Applicants:

Hans-peter Hohe, Heiligenstadt, DE;

Michael Hackner, Hemau OT Haag, DE;

Markus Stahl-offergeld, Erlangen, DE;

Inventors:

Hans-Peter Hohe, Heiligenstadt, DE;

Michael Hackner, Hemau OT Haag, DE;

Markus Stahl-Offergeld, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

An embodiment of a method for a determination, section after section, of a parameter-dependent correction value approximation course includes determining a first measurement signal value with a first parameter value associated with a sensor arrangement when the first parameter value fullfils a predetermined condition or a trigger condition is fulfilled, changing the first parameter value to obtain a second parameter value, determining a second signal value with the second parameter value and determining a second partial section of the correction value approximation course for a second parameter range based on a functional connection describing the second partial section, the first parameter value, the second parameter value, the first measurement signal value, the second measurement signal value and an initial correction value.


Find Patent Forward Citations

Loading…