The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Oct. 21, 2010
Daniel W. Tam, San Diego, CA (US);
Peder M. Hansen, San Diego, CA (US);
Daniel R. Gaytan, Chula Vista, CA (US);
Daniel W. Tam, San Diego, CA (US);
Peder M. Hansen, San Diego, CA (US);
Daniel R. Gaytan, Chula Vista, CA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A method for quantifying the effective loss of a mast-clamp-current-probe (MCCP) antenna comprising the following steps: providing a vector network analyzer (VNA) having first and second ports (Ports 1 and 2 respectively); coupling a transmit monopole antenna to Port 1 via a first transmission line; coupling a receive antenna to Port 2 via a second transmission line; determining the S-parameters of the two coupled antennas; calculating the power at the receive antenna (P); converting the transmit antenna to the MCCP antenna by shorting the transmit antenna to ground and clamping a current probe around the transmit antenna; determining the S'-parameters of the MCCP antenna and the receive antenna; calculating the power at the receive antenna (P′) when coupled to the MCCP antenna; and quantifying the effective loss of the MCCP antenna as the difference P−P′.