The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Jul. 27, 2004
Elliott H. Rachlin, Scottsdale, AZ (US);
Elliott H. Rachlin, Scottsdale, AZ (US);
Honeywell International Inc., Morristown, NJ (US);
Abstract
An impact assessment system and method for determining emerging criticality in a complex system is provided. The impact assessment system includes a component dependency model and an emergent criticality analyzer. The component dependency model describes the relationships between components in the system and their underlying dependency and criticality relationships. The impact assessment system receives component failure data from the complex system and uses the component dependency model and emergent criticality analyzer to determine the impact of the component failure on the criticality of remaining components in the system. The impact assessment system is thus able to determine how component failures in the complex system can impact the criticality of remaining components in the complex system and thus can assist in determining how those components may or may not be safely used in further operational activities.