The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Dec. 15, 2006
Francois Dupis, Pibrac, FR;
Xavier Hue, Cugnaux, FR;
Lionel Mongin, Cugnaux, FR;
Jacques Trichet, Cugnaux, FR;
Francois Dupis, Pibrac, FR;
Xavier Hue, Cugnaux, FR;
Lionel Mongin, Cugnaux, FR;
Jacques Trichet, Cugnaux, FR;
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A test unit for testing the frequency characteristics of one or more components of a transmitter of modulated signals. The test unit includes a data source for generating a test pattern of data. A test unit output is connected to the data source and connectable to an input of one or more of the components, for inputting the test pattern of data to the one or more components. The test unit includes a memory in which a first predetermined data sequence and a second predetermined data sequence are stored. The data source is connected with an data input to the memory, and the data source is arranged to generating the test pattern of data including the predetermined data sequences. When a modulated signal is generated in accordance with the test pattern of data will include a first signal part with a first frequency spectrum caused by the first predetermined data sequence and a second signal part after the first signal part, which second signal part has a second frequency spectrum caused by the second predetermined data sequence.