The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Oct. 23, 2008
Susumu Endo, Kawasaki, JP;
Takayuki Baba, Kawasaki, JP;
Shuichi Shiitani, Kawasaki, JP;
Yusuke Uehara, Kawasaki, JP;
Daiki Masumoto, Kawasaki, JP;
Susumu Endo, Kawasaki, JP;
Takayuki Baba, Kawasaki, JP;
Shuichi Shiitani, Kawasaki, JP;
Yusuke Uehara, Kawasaki, JP;
Daiki Masumoto, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A difference emphasizing apparatus aligns a first three-dimensional model and a second three-dimensional model in orientation and position in accordance with a predetermined rule, and gets data of respective apices of the first three-dimensional model and the second three-dimensional model. Based on the gotten data, the apparatus finds a corresponding point on the first three-dimensional model, which corresponds to the apex of the second three-dimensional model in a direction of a particular axis. When the corresponding point is detected, the apparatus calculates a difference between the first three-dimensional model and the second three-dimensional model in the direction of the particular axis based on the corresponding point and the apex of the second three-dimensional model. The apparatus enlarges the difference in the direction of the particular axis, and calculates a position of the apex of the second three-dimensional model after the enlargement.