The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Mar. 03, 2010
Uwe Siedenburg, Essenheim, DE;
Uwe Siedenburg, Essenheim, DE;
Smiths Heimann GmbH, Wiesbaden, DE;
Abstract
A method for improving the ability to recognize materials in an X-ray inspection system is provided that includes the steps of recording at least two absorption X-ray images of an object to be examined at different energies, mathematically modeling the object by a number of layers assuming a particular material for each layer, wherein an absorption value describes the absorptivity of a layer, the number of layers is less than or equal to the number of X-ray images and at least one layer is assumed to be a material to be recognized during the inspection, decomposing the absorption value of each layer into a path-dependent factor and an energy-dependent factor, calculating the path-dependent factors for all layers from the absorption X-ray images using the absorption equation, calculating at least one synthetic image from the sum of all layers of the product of the absorption values and the weighting factors, evaluating the synthetic image.