The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2012

Filed:

Aug. 27, 2008
Applicants:

Douglas Q. Abraham, Topsfield, MA (US);

Yesna Oyku Yildiz, Boston, MA (US);

Inventors:

Douglas Q. Abraham, Topsfield, MA (US);

Yesna Oyku Yildiz, Boston, MA (US);

Assignee:

Analogic Corporation, Peabody, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques and systems for segmenting one or more objects in a subject image resulting from subjecting one or more objects to imaging using an imaging apparatus are disclosed, such that limitations of image noise, object proximity, image intensity variations, shape complexity, and/or computational resources may be mitigated. Merely border edges of objects in a subject image can be generated, for example, by using edge detection and discarding interior edges. Geometric difference values of the identified boundaries of the objects in the subject image can be calculated. One or more transitions between objects can be identified by using the geometric difference values, for example, which may result in data that represents a location in the image of an object to be segmented.


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