The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2012

Filed:

Aug. 30, 2010
Applicants:

Susanne Madeline Lee, Cohoes, NY (US);

Peter Michael Edic, Albany, NY (US);

Forrest Frank Hopkins, Cohoes, NY (US);

Inventors:

Susanne Madeline Lee, Cohoes, NY (US);

Peter Michael Edic, Albany, NY (US);

Forrest Frank Hopkins, Cohoes, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 1/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

An X-ray imaging system that produces one or more fan-shaped beams is described. The system includes a target for emitting X rays that includes at least one target focal spot, and one or more graded multilayer optic devices in optical communication with the target. The optics transmits at least a portion of the source X rays to produce the one or more fan-shaped beams. The graded multilayer optic devices include at least a first graded multilayer section for redirecting and transmitting X rays through total internal reflection. The graded multilayer section includes a high-index layer of material having a first complex refractive index n, a low-index layer of material having a second complex refractive index n, and a grading zone disposed between the high-index and low-index layers of material. The grading zone includes a grading layer having a third complex refractive index nsuch that Re(n)>Re(n)>Re(n).


Find Patent Forward Citations

Loading…