The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2012

Filed:

Jun. 12, 2009
Applicants:

Jason R. Ensher, Lafayette, CO (US);

Paul C. Smith, Louisville, CO (US);

Ian B. Murray, Erie, CO (US);

Inventors:

Jason R. Ensher, Lafayette, CO (US);

Paul C. Smith, Louisville, CO (US);

Ian B. Murray, Erie, CO (US);

Assignee:

Akonia Holographics, LLC, Katonah, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01S 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

External cavity laser (ECL) systems and methods for measuring the wavelength of the ECL by using a portion of the positional light received by the position sensitive detector (PSD) to determine the position of a wavelength tuning element (such as a diffraction grating or an etalon), for determining the longitudinal laser mode or power output of the laser from a portion of the laser light received by a beam-shearing mode sensor, and by using a non-output beam(s) from a transmissive diffraction grating in the ECL to monitor the external cavity laser.


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