The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Dec. 07, 2009
Fumio Suzuki, Yokohama, JP;
Naoshi Aikawa, Fujisawa, JP;
Kotaro Yamaguchi, Kamakura, JP;
Nikon Corporation, Tokyo, JP;
Abstract
A confocal scanning microscope including: an objective system (second objective lensand objective lens) illuminating a sample SA with illumination light; a scanning mechanismscanning the sample SA to obtain an intensity signal; and a scanning optical systemprovided between the scanning mechanism and the objective system. The scanning optical system composed of, in order from the scanning mechanism side, a first positive lens group G, a second negative lens group G, and a third positive lens group G. The third lens group has two chromatic aberration correction portions each formed by a positive lens and a negative lens or negative lens and positive lens. Glass materials are selected such that one performs chromatization and the other performs achromatization, thereby providing a confocal scanning microscope capable of correcting lateral chromatic aberration generated in the objective system in the specific wavelength region by the scanning optical system.