The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Mar. 20, 2009
Michael Orthner, Salt Lake City, UT (US);
Florian Solzbacher, Salt Lake City, UT (US);
Loren Rieth, Salt Lake City, UT (US);
Michael Orthner, Salt Lake City, UT (US);
Florian Solzbacher, Salt Lake City, UT (US);
Loren Rieth, Salt Lake City, UT (US);
University of Utah Research Foundation, Salt Lake City, UT (US);
Abstract
A testing and analysis system for a pressure-sensitive device () that includes a testing stage () comprising a platform having a groove situated on an upper surface, an endless support gasket located in the endless groove, a pressure port located on the upper surface and interior to the endless groove, and a means for securing a substrate above the upper surface. The substrate () supports a pressure-sensitive device () to form a pressure chamber between the substrate () and the upper surface. A pressure source () is operatively connected to the pressure port to modify a pressure inside the pressure chamber and deflect the pressure-sensitive device (). A surface profile measurement apparatus () is included for measuring a surface profile of the deflected pressure-sensitive device ().