The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2012

Filed:

Jan. 22, 2009
Applicants:

Ryosuke Yamada, Ehime, JP;

Masahiro Aga, Ehime, JP;

Koji Miyoshi, Ehime, JP;

Kenji Murakami, Ehime, JP;

Hideyuki Kurokawa, Ehime, JP;

Takahiko Tanida, Ehime, JP;

Inventors:

Ryosuke Yamada, Ehime, JP;

Masahiro Aga, Ehime, JP;

Koji Miyoshi, Ehime, JP;

Kenji Murakami, Ehime, JP;

Hideyuki Kurokawa, Ehime, JP;

Takahiko Tanida, Ehime, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a device in which light from a samplefixed in a test pieceis captured by an image sensorthrough an optical system made up of a lens, a diaphragm, and so on and concentration information is obtained, wherein a wide-band light sourcefor illuminating the test pieceis combined with an optical filterfor optionally selecting a wavelength of the light captured by the image sensor. Thus it is possible to reduce a measurement error caused by a change of the light quantity distribution of the light source


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