The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Mar. 16, 2010
Ming Yang, Fairport, NY (US);
Ming Yang, Fairport, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
A method and system for calibrating a multiple-beam curvature/flatness sensor in order to provide an accurate media curvature/flatness measurement. One or more flat media sheets are passed through a multiple-beam media curvature/flatness sensor and the timing data associated with the lead edge/trail edge crossing each beam associated with the multiple beam curvature/flatness sensor is used for the calibration of the curvature/flatness sensor system. The unknown variables in the media curvature/flatness equation which takes into consideration of the manufacture and assembly errors of the sensor as well as the media deflection due to gravity can be determined and eliminated in order to obtain a calibrated media curvature/flatness equation. The calibrated media curvature/flatness equation can further be applied in the curvature/flatness measurement in order to achieve accurate measurement results.