The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Apr. 30, 2010
Hyoung Joon Kim, Suwon-si, KR;
Whoi Yul Kim, Seoul, KR;
Jin Aeon Lee, Suwon-si, KR;
Yeul Min Baek, Seoul, KR;
Hyoung Joon Kim, Suwon-si, KR;
Whoi Yul Kim, Seoul, KR;
Jin Aeon Lee, Suwon-si, KR;
Yeul Min Baek, Seoul, KR;
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Abstract
A method is for processing a Bayer domain signal of an image sensor to model an integrated noise in the image sensor. The method includes receiving the Bayer domain signal of the image signal, setting a plurality of noise models using the Bayer domain signal, and determining an integrated noise level in the image sensor based on the plurality of noise models. The noise models include a dark-current noise model, a shot noise model and a fixed-pattern noise model.