The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2012

Filed:

Jun. 03, 2009
Applicants:

Jerome Mertz, Boston, MA (US);

Daryl Lim, Brookline, MA (US);

Kengyeh K. Chu, Brighton, MA (US);

Inventors:

Jerome Mertz, Boston, MA (US);

Daryl Lim, Brookline, MA (US);

Kengyeh K. Chu, Brighton, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A first image data set of the real-world object is received at a processor where the real-world object was illuminated with substantially uniform illumination. A second image data set of the real-world object is received at the processor where the real-world object was illuminated with substantially structured illumination. A high pass filter is applied to the first-image data set to remove out-of-focus content and retrieve high-frequency in-focus content. The local contrast of the second-image data set is determined producing a low resolution local contrast data set. The local contrast provides a low resolution estimate of the in-focus content in the first-image data set. A low pass filter is applied to the estimated low resolution in-focus data set, thus making its frequency information complementary to the high-frequency in-focus data set. The low and high frequency in-focus data sets are combined to produce an optically-sectioned data set of the real-world object.


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