The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Aug. 03, 2009
Shiddharta Nandy, Tyne and Wear, GB;
Shiddharta Nandy, Tyne and Wear, GB;
Genetix Corporation, San Jose, CA (US);
Abstract
A method for generating a fluorescence microscopy image of a sample. The method comprises a step of obtaining a series of fluorescence microscopy images of the sample for a plurality of different focal plane depths in the sample and different exposure times. The images may be obtained directly from a microscope, or from a library of images. Images comprising the series of fluorescence microscopy images are combined to form a single resultant fluorescence microscopy image of the sample. The single resultant image may then be analyzed as if it were a conventional fluorescence microscopy image, e.g. by visual inspection or numerical processing. However, because the resultant image is based on images from a range of focal plane depths and exposure times, different structures that appear under only certain conditions (i.e. in only certain ones of the original series of fluorescence microscopy images) can appear together in a single image, thus simplifying visualization, interpretation and analysis of the sample.