The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2012

Filed:

Jan. 03, 2008
Applicant:

Mark E. Orazem, Gainesville, FL (US);

Inventor:

Mark E. Orazem, Gainesville, FL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for assessment of a pipe () is provided. The system can include a probe () having first () and second () electrodes and a processor () in communication with the probe (). The probe () can be in a medium () proximate to a section of the pipe () to be analyzed. The section of the pipe () can have a coating () thereon. The processor () can measure a difference in potential between the first () and second () electrodes. The processor () can determine a local impedance with respect to the section of the pipe () based at least in part on the difference in potential. The processor () can evaluate a condition of the coating () on the section of the pipe () based at least in part on the local impedance or a parameter derived from the local impedance.


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