The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2012

Filed:

Jan. 19, 2010
Applicants:

Yi-sheng Wang, Taipei, TW;

Chung-hsuan Chen, Knoxville, TN (US);

Inventors:

Yi-Sheng Wang, Taipei, TW;

Chung-Hsuan Chen, Knoxville, TN (US);

Assignee:

Academia Sinica, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An angled dual-polarity mass spectrometer includes a dual-polarity ion generator, a first mass analyzer, and a second mass analyzer. The dual-polarity ion generator includes an ion source to generate positive ions and negative ions from a sample, and electrodes to generate electric fields for guiding the negative ions into a beam of negative ions and guiding the positive ions into a beam of positive ions. The first mass analyzer can analyze the negative ions, and the second mass analyzer can analyze the positive ions. The central axes of the first and the second mass analyzers are at an angle between 0 to 179 degrees.


Find Patent Forward Citations

Wang, Yi-Sheng. (2012). Angled dual-polarity mass spectrometer (U.S. Patent No. 8309913). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8309913

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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