The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Nov. 17, 2009
Applicants:
Donald R. Schropp, Jr., Austin, TX (US);
Richard Lee Fink, Austin, TX (US);
Igor Pavlovsky, Austin, TX (US);
Inventors:
Donald R. Schropp, Jr., Austin, TX (US);
Richard Lee Fink, Austin, TX (US);
Igor Pavlovsky, Austin, TX (US);
Assignee:
Applied Nanotech Holdings, Inc., Austin, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D 59/44 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An ion trap instrument working at atmospheric pressure, which alleviates requirements of bulky, power consuming vacuum pumps. Traps can accumulate selected ion species, effectively concentrating the analyte of interest and allowing laser spectroscopy to be performed. This lowers the detection threshold of this instrument compared to others and increases the selectivity.