The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Mar. 24, 2010
Hong-gang Wang, Palmyra, PA (US);
Domenico Coppola, Tampa, FL (US);
Hong-Gang Wang, Palmyra, PA (US);
Domenico Coppola, Tampa, FL (US);
University of South Florida, Tampa, FL (US);
Abstract
The invention includes methods for detecting the presence of a neoplastic condition by comparing a sample level of a BIF-1 to a reference, wherein a low level of BIF-1 in the sample correlates with the presence of a neoplastic condition. Another method involves determining the risk of relapse, tumor recurrence and/or metastasis by determining a sample level of a Bif-1 to a reference level of Bif-1, wherein low sample levels correlate with a likelihood of relapse, recurrence and/or metastasis. Yet another method includes detecting the presence of a pre-neoplastic condition, such as prostatic intraepithelial neoplasia. The method involves measuring a level of a Bif-1 in a sample and comparing the level of Bif-1 in the sample to a reference level of Bif-1. High levels of Bif-1 in the sample correlate with the presence of the pre-neoplastic condition.