The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2012

Filed:

May. 26, 2009
Applicants:

Hayato Miyoshi, Kanagawa, JP;

Yoshihide Iwaki, Kanagawa, JP;

Toshihiro Mori, Kanagawa, JP;

Inventors:

Hayato Miyoshi, Kanagawa, JP;

Yoshihide Iwaki, Kanagawa, JP;

Toshihiro Mori, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention describes methods for discriminating between nucleotide sequences of first and second nucleic acids, including: providing a reaction solution, including a deoxynucleotide triphosphate, a DNA polymerase with strand displacement ability, a template nucleic acid fragment, a primer, and a mask oligo; incubating the reaction solution, obtaining a polymerase reaction, and producing an amplification product; detecting the amplification product to discriminate between the nucleotide sequences, wherein the primer is complementary to the first nucleic acid, the mask oligo hybridizes to the nucleotide sequence portion of the first and second nucleic acid, wherein the mask oligo is more complementary to the second nucleic acid than to the first nucleic acid, and wherein the mask oligo is not an origin of an elongation reaction with the polymerase, and a primer portion and a mask oligo portion hybridize to the same regions on the first and second nucleic acid.


Find Patent Forward Citations

Loading…