The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Apr. 23, 2009
Volodymyr I Redko, Coral Springs, FL (US);
Elena M Shembel, Coral Springs, FL (US);
Volodymyr S Khandetskyy, Dnipropetrovsk, UA;
Dayal T Meshri, Tulsa, OK (US);
Isaac a Angres, Gaitherburg, MD (US);
Robert Adams, Owasso, OK (US);
Dmytro Sivtsov, Dnipropetrovs, UA;
Oxana V Redko, Dnipropetrovsk, UA;
Tymofiy V Pastushkin, Ft. Lauderdale, FL (US);
Volodymyr I Redko, Coral Springs, FL (US);
Elena M Shembel, Coral Springs, FL (US);
Volodymyr S Khandetskyy, Dnipropetrovsk, UA;
Dayal T Meshri, Tulsa, OK (US);
Isaac A Angres, Gaitherburg, MD (US);
Robert Adams, Owasso, OK (US);
Dmytro Sivtsov, Dnipropetrovs, UA;
Oxana V Redko, Dnipropetrovsk, UA;
Tymofiy V Pastushkin, Ft. Lauderdale, FL (US);
Enerize Corporation, Coral Springs, FL (US);
Abstract
A system for non-destructive determination of the degree of fluorination in carbon monofluoride (CFx) during the process of CFx synthesis is described. The system includes a measuring generator containing a capacitive sensor for measuring a respective capacitance, a base generator containing a capacitive sensor for measuring a base capacitance, and a processor for determining a difference between the respective capacitance and the base capacitance. The system is configured to determine the degree of fluorination based on the difference between the respective capacitance and the base capacitance.