The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Mar. 01, 2004
Antonius Franciscus Wilhelmus Van Der Steen, Rotterdam, NL;
Christoffel Leendert DE Korte, Driebergen, NL;
Frits Mastik, Rotterdam, NL;
Johannes Antonius Schaar, Rotterdam, NL;
Antonius Franciscus Wilhelmus van der Steen, Rotterdam, NL;
Christoffel Leendert de Korte, Driebergen, NL;
Frits Mastik, Rotterdam, NL;
Johannes Antonius Schaar, Rotterdam, NL;
Stichting voor de Technische Wetenschappen, Utrecht, NL;
Abstract
A method for generating hardness information of tissue subject to a varying pressure. The method comprises receiving signals from the tissue from a sensor for measuring the deformation of the tissue in a measuring plane defined by the sensor, which sensor, during a varying pressure exerted on the tissue, is moved along the tissue in a direction transverse to the measuring plane; identifying strain of the tissue from the resulting signals; and relating the strain to elasticity and/or hardness parameters of the tissue. The method may comprise the step of displaying elasticity and/or hardness parameters of a tissue surface or tissue volume part extending practically parallel to the direction of motion of the sensor.