The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2012
Filed:
Aug. 29, 2008
Gilbert Laurenti, Saint Paul de Vence, FR;
Gary A. Cooper, Pittsburgh, PA (US);
Gilbert Laurenti, Saint Paul de Vence, FR;
Gary A. Cooper, Pittsburgh, PA (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
In a method for tracing data within an integrated circuit, a default time stamp granularity is selected for a sequence of time stamps, wherein each time stamp has a resolution of 2**N. A sequence of trace events is captured and an elapsed time is determined between each time sequential pair of trace events in the sequence of trace events. A time stamp is formed to associate with each trace event of the sequence of trace events, wherein each time stamp has an associated time stamp granularity, wherein the time stamp has the default time stamp granularity if the elapsed time between a current trace event and a sequentially prior trace event is less than 2**N time slots, otherwise the time stamp granularity is slid to a larger value such that the elapsed time can be represented by N bits, whereby a small number N of bits can accurately represent a large range of elapsed times.