The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2012
Filed:
Feb. 28, 2008
Shawn J. Beard, Livermore, CA (US);
Fu-kuo Chang, Stanford, CA (US);
Shawn J. Beard, Livermore, CA (US);
Fu-Kuo Chang, Stanford, CA (US);
Acellent Technologies, Inc., Sunnyvale, CA (US);
Abstract
Predicting the probability of detection of major and minor defects in a structure includes simulating a plurality of N defects at random locations in a region specified by an array of transducers. Defect size is incremented until it intersects one path between two transducers. The defect size is again incremented until it intersects two or more adjacent paths between pairs of transducers. The number of major defects up to a selected size is determined by the total number of single path intersections by defects up to the selected size. The number of minor defects up to a selected size is determined on the basis of the total number of defects intersecting two or more paths up to the selected size. The probability of detection up to a selected size is the cumulative number of major or minor defects up to the selected size normalizing by N.