The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2012

Filed:

Oct. 02, 2009
Applicants:

Nic G. Bloomfield, Newmarket, CA;

Gordana Ivosev, Etobicoke, CA;

Inventors:

Nic G. Bloomfield, Newmarket, CA;

Gordana Ivosev, Etobicoke, CA;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 31/00 (2006.01); G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Reference features are updated based on a previous scan during each mass spectrometry scan of a sample. Reference features with reference feature confidence values are generated from a plurality of initial scans. For each subsequent scan of a sample, sample features and sample feature confidence values are calculated. The reference features and sample features are aligned to determine common features. Constants are determined for an equation of mass of the mass spectrometer using confidence weighted regression of the common features. The constants and the equation of mass are used to calculate new mass values for the sample features. The reference features are updated using the sample features and the reference feature confidence values are recalculated in order to maintain the accuracy of reference features for calibration.


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