The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2012

Filed:

Aug. 31, 2006
Applicants:

Stepan Obdrzalek, Prague, CZ;

Jiri Matas, Roztoky u Prahy, CZ;

Katsuhiro Sakai, Brussels, BE;

Inventors:

Stepan Obdrzalek, Prague, CZ;

Jiri Matas, Roztoky u Prahy, CZ;

Katsuhiro Sakai, Brussels, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image search method that is robust and fast (with computational complexity of logarithmic order relative to the number of models). The image search includes extracting a plurality of regions from one or more model images and normalizing the regions as standard regions; setting a specific region in each normalized standard region and classifying the plurality of standard regions under two or more subsets on the basis of a feature of the specific region; iteratively performing an operation of setting another specific region at a location different from that of the aforementioned specific region in each standard region classified in each subset and classifying the plurality of standard regions under still more subsets on the basis of a feature of the other specific region; and outputting the locations of the specific regions in the standard regions in the respective classifications and the features of the specific regions in the classifications.


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