The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2012
Filed:
Aug. 31, 2009
Frédéric Noo, Midvale, UT (US);
Harald Schöndube, Erlangen, DE;
Karl Stierstorfer, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
University of Utah Research Foundation, Salt Lake City, UT (US);
Abstract
At least one embodiment of the invention relates to a method for the reconstruction of image data of an examined object from measuring data, wherein the measuring data were detected by a detector within and outside of its Tam-Danielsson window during a relative spiral movement between a radiation source of a computer tomography system and the examined object. As a result of the spiral movement, the measuring data outside of the Tam-Danielsson contain interruptions. A mathematically precise first reconstruction of first image data is realized in at least one embodiment based on the measuring data by using only measuring data from the Tam-Danielsson window. A mathematically precise second reconstruction is furthermore realized of second image data from the measuring data in at least one embodiment, using at least among other things measuring data from outside of the Tam-Danielsson window, wherein the interruption of the measuring data is compensated for by using existing measuring data and/or the first image data and/or other image data obtained from existing measuring data. Finally, the first image data and the second image data are combined.