The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2012
Filed:
Feb. 25, 2008
Applicants:
Craig H. Meyer, Charlottesville, VA (US);
Weitian Chen, Union City, CA (US);
Peng HU, Quincy, MA (US);
Inventors:
Craig H. Meyer, Charlottesville, VA (US);
Weitian Chen, Union City, CA (US);
Peng Hu, Quincy, MA (US);
Assignee:
University of Virginia Patent Foundation, Charlottesville, VA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
In MR imaging using a multi-coil device, multifrequency interpolation is combined with a convolution such as BOSCO to achieve simultaneous parallel reconstruction and off-resonance correction. The unaliased and deblurred image is calculated for each coil, and the final image is formed from the images for all of the coils.
Meyer, Craig. (2012). Method and system for off-resonance correction for non-cartesian parallel image reconstruction (U.S. Patent No. 8306289). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8306289
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile