The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2012
Filed:
Jul. 27, 2009
LI Zhang, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Kejun Kang, Beijing, CN;
Haifeng HU, Beijing, CN;
Yuxiang Xing, Beijing, CN;
Xinhui Duan, Beijing, CN;
Yuanjing LI, Beijing, CN;
Yinong Liu, Beijing, CN;
Qingping Huang, Beijing, CN;
Li Zhang, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Kejun Kang, Beijing, CN;
Haifeng Hu, Beijing, CN;
Yuxiang Xing, Beijing, CN;
Xinhui Duan, Beijing, CN;
Yuanjing Li, Beijing, CN;
Yinong Liu, Beijing, CN;
Qingping Huang, Beijing, CN;
Tsinghua University, , CN;
Nuctech Company Limited, , CN;
Abstract
Disclosed is an image reconstruction method in a high-energy dual-energy CT system. The method comprises steps of scanning an objection with high-energy dual-energy rays to obtain high-energy dual-energy projection values, calculating projection values of base material coefficients corresponding to the dual-energy projection values on the basis of a pre-created lookup table or by analytically solving a set of equations, and obtaining an image of base material coefficient distribution based on the projection values of base material coefficients. The method provides a solution for reconstruction with high-energy dual energy CT technology and thus a more effective approach for substance identification and contraband inspection, thereby bringing a significant improvement on accuracy and efficiency in security inspection.