The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2012

Filed:

Jun. 09, 2011
Applicant:

Masahiro Mizuta, Yokohama, JP;

Inventor:

Masahiro Mizuta, Yokohama, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A microscope apparatus configured to enlarge entrance pupils while maintaining the rotational symmetry of optical systems of a plurality of optical paths after ejection of light from an objective lens to bring out the performance of the objective lens. A microscope apparatus includes an objective lens having a function of collecting light from the object; and optical paths in which all lens groups are rotational symmetric systems and through which light exited from the objective lens passes, wherein when a sum of maximum diameters of entrance pupils of optical systems forming any two of the optical paths is set as ΣDi, and an axial luminous flux diameter determined from a maximum aperture angle α and a focal distance f of the objective lens is set as Dobj, a condition of the following expression is satisfied, ΣDi>Dobj where Dobj=2·f·sin α.


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