The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2012
Filed:
May. 28, 2010
Hong Tan, San Jose, CA (US);
Yushan Tan, Shanghai, CN;
Duan Jun Chen, East Brunswick, NJ (US);
Krista Leah Witte, Hayward, CA (US);
Hong Tan, San Jose, CA (US);
Yushan Tan, Shanghai, CN;
Duan Jun Chen, East Brunswick, NJ (US);
Krista Leah Witte, Hayward, CA (US);
Pall Corporation, Port Washington, NY (US);
Abstract
Apparatus and method for detecting the presence or amount or rate of binding of an analyte in a sample solution is disclosed. The apparatus includes an optical assembly having first and second reflecting surfaces separated by a distance 'd' greater than 50 nm, where the first surface is formed by a layer of analyte-binding molecules, and a light source for directing a beam of light onto said first and second reflecting surface. A detector in the apparatus operates to detect a change in the thickness of the first reflecting layer resulting from binding of analyte to the analyte-binding molecules, when the assembly is placed in the solution of analyte, by detecting a shift in phase of light waves reflected from the first and second surfaces.