The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2012
Filed:
Jun. 03, 2008
Hidenao Iwai, Hamamatsu, JP;
Toyohiko Yamauchi, Hamamatsu, JP;
Hidenao Iwai, Hamamatsu, JP;
Toyohiko Yamauchi, Hamamatsu, JP;
Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
An optical property measurement apparatus includes a light source unit, a first optical coupler, a second optical coupler, a lens, a lens, a phase modulation unit, a drive unit, an optical path length difference adjustment unit, a control unit, a light receiving unit, a synchronization detection unit, and a measurement unit. The phase modulation unit carries out phase modulation with a frequency f. The synchronization detection unit outputs a first signal having a value corresponding to a magnitude of a component of the frequency f included in an electrical signal output from the light receiving unit, and also outputs a second signal having a value corresponding to a magnitude of a component of the frequency 2included in the electrical signal. The control unit controls the optical path length difference adjusted by the optical path length difference adjustment unit to be a predetermined value based on the first signal or the second signal output from the synchronization detection unit.