The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2012

Filed:

Apr. 30, 2010
Applicants:

Jason D. Mudge, Los Altos, CA (US);

Miguel Virgen, Santa Clara, CA (US);

Inventors:

Jason D. Mudge, Los Altos, CA (US);

Miguel Virgen, Santa Clara, CA (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging polarimeter and a method of utilizing the imaging polarimeter are provided. The method includes receiving a first light ray at a beam splitter and splitting the first light ray into second, third, fourth, and fifth light rays such that the second, third, fourth, and fifth light rays are simultaneously received on a flat focal plane. The method further includes outputting first, second, third, and fourth signals indicative of first, second, third, and fourth intensities, respectively, of the second, third, fourth, and fifth light rays, respectively, utilizing a sensor array disposed on the focal plane. The method further includes determining first, second, third, and fourth Stokes parameters for a pixel of the sensor array based on the first, second, third, and fourth signals, respectively, utilizing a computer.


Find Patent Forward Citations

Loading…