The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2012

Filed:

Jun. 23, 2009
Applicants:

Neil Goldstein, Belmont, MA (US);

Jason A. Cline, Burlington, MA (US);

Pajo Vujkovic-cvijin, Burlington, MA (US);

Steven M. Adler-golden, Newtonville, MA (US);

Marsha J. Fox, Lexington, MA (US);

Brian Gregor, Waltham, MA (US);

Jamine Lee, Burlington, MA (US);

Inventors:

Neil Goldstein, Belmont, MA (US);

Jason A. Cline, Burlington, MA (US);

Pajo Vujkovic-Cvijin, Burlington, MA (US);

Steven M. Adler-Golden, Newtonville, MA (US);

Marsha J. Fox, Lexington, MA (US);

Brian Gregor, Waltham, MA (US);

Jamine Lee, Burlington, MA (US);

Assignee:

Spectral Sciences, Inc., Burlington, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

An adaptive spectral sensor, and methods of using the sensor. The sensor uses a programmable band pass transmission filter to produce both contrast signals, which discriminate specific target materials from background materials by comparing spectral signatures in hardware, and scene radiance spectra. The adaptive spectral sensor may measure one or more scene spectra and may form a spectral image. The sensor may automatically adjust to changing spectral, spatial and temporal conditions in the environment being monitored, by changing sensor resolution in those dimensions and by changing the detection band pass. The programmable band pass can be changed on-the-fly in real time to implement a variety of detection techniques in hardware or measure the spatial or spectral signatures of specific materials and scenes.


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