The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2012

Filed:

Aug. 18, 2010
Applicants:

Kimihiko Arimoto, Kyoto, JP;

Kunio Ohtsuki, Kyoto, JP;

Yoko Nakai, Kyoto, JP;

Inventors:

Kimihiko Arimoto, Kyoto, JP;

Kunio Ohtsuki, Kyoto, JP;

Yoko Nakai, Kyoto, JP;

Assignee:

Horiba, Ltd., , JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/427 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention is to make the detection sensitivities as even as possible among a plurality of specimens to be inspected in an analyzer that leads light transmitted from the plurality of specimens to be inspected to a single spectrometer via optical fibers, the analyzer includes first and second light guide members provided for every first and second specimen to be inspected so as to lead the light obtained from each of the specimens to be inspected to a photo-detecting part, and light projection side end portions of a plurality of optical fiber elements composing the first and second light guide members are arranged in mixture.


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