The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2012

Filed:

Mar. 25, 2010
Applicants:

Toshihiro Mori, Amagasaki, JP;

Shinichi Tsukuda, Amagasaki, JP;

Inventors:

Toshihiro Mori, Amagasaki, JP;

Shinichi Tsukuda, Amagasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scanning-type distance measuring apparatus includes: an optical systemhaving a first deflecting memberthat deflects measurement light output from a light transmitting unittoward a space to be measured via an optical window, a light receiving lensthat condenses reflection light from an object R to be measured existing in the space to be measured, and a second deflecting memberthat deflects the reflection light passed through the light receiving lens toward a light receiving unitdisposed to oppose the light transmitting unit; a scanning mechanismthat rotates the optical systemabout a predetermined axis P; and an optical memberthat outputs the measurement light deflected by the first deflecting memberfrom an incident light path Lc of the reflection light to the second deflecting member


Find Patent Forward Citations

Mori, Toshihiro. (2012). Scanning-type distance measuring apparatus (U.S. Patent No. 8305561). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8305561

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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