The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2012

Filed:

Jan. 13, 2011
Applicants:

Alan P. Smith, Santa Clara, CA (US);

Robert P. Masleid, Monte Sereno, CA (US);

Georgios Konstadinidis, San Jose, CA (US);

Inventors:

Alan P. Smith, Santa Clara, CA (US);

Robert P. Masleid, Monte Sereno, CA (US);

Georgios Konstadinidis, San Jose, CA (US);

Assignee:

Oracle International Corporation, Redwood City, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K 3/289 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining flop circuit types includes performing a layout of an IC design including arranging master and slave latches of each of a plurality of flops to receive first and second clock signals, respectively. The initial IC design may then be implemented (e.g., on a silicon substrate). After implementation, the IC may be operated in first and second modes. In the first mode, the master latch of each flop is coupled to receive a first clock signal. In the second mode, the first clock signal is inhibited and the master latch is held transparent. The slave latch of each flop operates according to a second clock signal in both the first and second modes. The method further includes determining, for each flop, whether that flop is to operate as a master-slave flip-flop or as a pulse flop in a subsequent revision of the IC.


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