The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2012
Filed:
Sep. 11, 2009
Ling-yu Xie, Shenzhen, CN;
Sheng-chung Huang, Taipei Hsien, TW;
Kun-lung Wu, Taipei Hsien, TW;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;
Abstract
A system for testing a power supply unit includes a test sub-system and a test control sub-system connected to the test sub-system and the power supply unit. The test sub-system perform tests and record the results. The test control sub-system is capable of selecting test items to test the power supply unit and setting an execution sequence of the test items. The test items includes a standby test item for testing the power supply unit at a standby state, a normal test item for testing the power supply unit at a normal state, and an over temperature protection test item for testing the power supply unit at an over heated state. The test control sub-system is further capable of automatically switching the standby test item to the normal test item, and switching the normal test item to the over temperature protection test item.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile