The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2012
Filed:
Jun. 01, 2010
Nielson Wade Schulenburg, Herndon, VA (US);
David Wheeler Warren, Los Angeles, CA (US);
Donald J. Rudy, San Pedro, CA (US);
Michael G. Martino, Inwood, WV (US);
Mark Alan Chatelain, Amissville, VA (US);
Michael Arthur Rocha, Centreville, VA (US);
Nielson Wade Schulenburg, Herndon, VA (US);
David Wheeler Warren, Los Angeles, CA (US);
Donald J. Rudy, San Pedro, CA (US);
Michael G. Martino, Inwood, WV (US);
Mark Alan Chatelain, Amissville, VA (US);
Michael Arthur Rocha, Centreville, VA (US);
The Aerospace Corporation, El Segundo, CA (US);
Abstract
A method for measuring spectral characteristics includes capturing spectral-spatial data that includes radiance measurements over spectrally flat, highly emissive surface portions of a sample material and heater at least two different heater temperatures for transmissive and/or emissive configurations. Temperatures of the sample material and heater are determined at the different heater temperatures for each configuration using, in each instance, radiance measurements taken after the temperatures of the heater and sample material have both stabilized. The transmissivity of the sample material is determined using the temperatures determined in the transmissive configuration and spectral-spatial data collected at selected points of interest over the sample material. The emissivity of the sample material is determined using the temperatures determined in the emissive configuration, the spectral-spatial data collected at selected points of interest over the sample material, and the transmissivity. The reflectivity of the sample material is determined using the emissivity and transmissivity.