The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2012
Filed:
Jan. 15, 2010
Applicants:
Justin Samek, Voorhees, NJ (US);
James A. Nahill, Turnersville, NJ (US);
Inventors:
Justin Samek, Voorhees, NJ (US);
James A. Nahill, Turnersville, NJ (US);
Assignee:
Metrologic Instruments, Inc., Blackwood, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for collecting and processing information bearing indicia (IBI) comprising the steps of: converting light reflected off an IBI into IBI signals representative of the IBI; running at least one signal process for processing the IBI signals on a first processor if the IBI is of a first type; and running at least one signal process for processing the IBI signals on a second processor if the IBI is of a second type, wherein the first processor and second processor are configured to run in parallel.