The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2012
Filed:
Apr. 15, 2010
Ying Yang, Shenzhen, CN;
Ling-yu Huang, Shenzhen, CN;
Yan-feng Yang, Shenzhen, CN;
Zhan-wei Huang, Shenzhen, CN;
Ying Yang, Shenzhen, CN;
Ling-Yu Huang, Shenzhen, CN;
Yan-Feng Yang, Shenzhen, CN;
Zhan-Wei Huang, Shenzhen, CN;
Shenzhen Futaihong Precision Industry Co., Ltd., ShenZhen, Guangdong Province, CN;
FIH (Hong Kong) Limited, Kowloon, HK;
Abstract
A testing system is used to testing a flip type electronic device having a main body, and a cover. The testing system includes a fixing structure, a flipping structure, a sensing device, a rotating mechanism, and a control device. The fixing structure positions the main body. The fixing structure flips the cover until a rotation degree of the cover and the main body reaches a threshold degree. The sensing device senses is pressed by the cover when the cover automatically rotates relative to the main body and generates electrical pressure signals according to the mount of pressure. The control device controls the rotating mechanism to drive the flipping structure to rotate and judges whether the flipping performance of the electronic device is normal according to the electrical pressure signals.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile